Oscillation-Based Test in Mixed-Signal Circuits /
Sánchez, Gloria Huertas.
Oscillation-Based Test in Mixed-Signal Circuits / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz. - xv, 452 páginas recurso en línea. - Frontiers in Electronic Testing, 36 0929-1296 ; .
Springer eBooks
Oscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation.
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
9781402053153
10.1007/1402053150 doi
TK7888.4
Oscillation-Based Test in Mixed-Signal Circuits / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz. - xv, 452 páginas recurso en línea. - Frontiers in Electronic Testing, 36 0929-1296 ; .
Springer eBooks
Oscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation.
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
9781402053153
10.1007/1402053150 doi
TK7888.4