In-situ materials characterization :
In-situ materials characterization : across spatial and temporal scales /
edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken.
- xi, 256 páginas : 124 ilustraciones, 78 ilustraciones en color.
- Springer Series in Materials Science, 193 0933-033X ; .
Springer eBooks
Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.
9783642451522
QC176.8.N35
Springer eBooks
Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.
9783642451522
QC176.8.N35