Applied Scanning Probe Methods XII : Characterization / edited by Bharat Bhushan, Harald Fuchs.

Springer eBooks

Direct Force Measurements of Receptor–Ligand Interactions on Living Cells -- Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM -- Applications of Scanning Near-Field Optical Microscopy in Life Science -- Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM -- Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning -- Mechanical Properties of Metallic Nanocontacts -- Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids -- Microtensile Tests Using In Situ Atomic Force Microscopy -- Scanning Tunneling Microscopy of the Si(111)-7×7 Surface and Adsorbed Ge Nanostructures.

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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