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Mems and nanotechnology, volume 8 : proceedings of the 2014 annual conference on experimental and applied mechanics / edited by Barton C. Prorok, LaVern Starman, Jennifer Hay, Gordon Shaw, III.

Colaborador(es): Tipo de material: TextoTextoSeries Conference Proceedings of the Society for Experimental Mechanics SeriesEditor: Cham : Springer International Publishing : Springer, 2015Descripción: vii, 83 páginas : 67 ilustracionesTipo de contenido:
  • texto
Tipo de medio:
  • computadora
Tipo de portador:
  • recurso en línea
ISBN:
  • 9783319070049
Formatos físicos adicionales: Edición impresa:: Sin títuloClasificación LoC:
  • T174.7
Recursos en línea:
Contenidos:
Newly Discovered Pile Up Effects During Nanoindentation -- Spring Constant Characterization of a Thermally Tunable MEMS Regressive Spring -- Shape Optimization of Cantilevered Devices for Piezoelectric Energy Harvesting -- Bonded Hemishell Approach to Encapsulate Microdevices in Spheroidal Packages -- Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array -- Modeling and Testing RF Meta-Atom Designs for Rapid Metamaterial Prototyping -- Pyroelectric AlN Thin Films Used as a MEMS IR Sensing Material -- In Situ Energy Loss and Internal Friction Measurement of Nanocrystalline Copper Thin Films Under Different Temperature -- Effect of Current Density and Magnetic Field on the Growth and Morphology of Nickel Nanowires.
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Newly Discovered Pile Up Effects During Nanoindentation -- Spring Constant Characterization of a Thermally Tunable MEMS Regressive Spring -- Shape Optimization of Cantilevered Devices for Piezoelectric Energy Harvesting -- Bonded Hemishell Approach to Encapsulate Microdevices in Spheroidal Packages -- Development of an Infrared Direct Viewer Based on a MEMS Focal Plane Array -- Modeling and Testing RF Meta-Atom Designs for Rapid Metamaterial Prototyping -- Pyroelectric AlN Thin Films Used as a MEMS IR Sensing Material -- In Situ Energy Loss and Internal Friction Measurement of Nanocrystalline Copper Thin Films Under Different Temperature -- Effect of Current Density and Magnetic Field on the Growth and Morphology of Nickel Nanowires.

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