Mems and nanotechnology, volume 5 : proceedings of the 2015 annual conference on experimental and applied mechanics / edited by Barton C. Prorok, LaVern Starman.
Tipo de material:
TextoSeries Conference Proceedings of the Society for Experimental Mechanics SeriesEditor: Cham : Springer International Publishing : Springer, 2016Edición: 1st ed. 2016Descripción: vii, 108 páginas : 98 ilustraciones, 47 ilustraciones en colorTipo de contenido: - texto
- computadora
- recurso en línea
- 9783319224589
- T174.7
Contenidos:
From the Contents: Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces -- Keynote: In situ TEM Nanomechanical Testing -- Poisson's Ratio as a Damage Index Sensed By Dual-embedded Fiber Bragg Grating Sensor -- In Situ High-Rate Mechanical Testing in the Dynamic Transmission Electron Microscope.
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From the Contents: Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces -- Keynote: In situ TEM Nanomechanical Testing -- Poisson's Ratio as a Damage Index Sensed By Dual-embedded Fiber Bragg Grating Sensor -- In Situ High-Rate Mechanical Testing in the Dynamic Transmission Electron Microscope.
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