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Applied Rasch Measurement: A Book of Exemplars : Papers in Honour of John P. Keeves / edited by Rupert Maclean, Ryo Watanabe, Robyn Baker, Boediono, Yin Cheong Cheng, Wendy Duncan, John Keeves, Zhou Mansheng, Colin Power, J. S. Rajput, Konai Helu Thaman, Sivakumar Alagumalai, David D. Curtis, Njora Hungi. por
- Maclean, Rupert [editor.]
- Watanabe, Ryo [editor.]
- Baker, Robyn [editor.]
- Boediono [editor.]
- Cheng, Yin Cheong [editor.]
- Duncan, Wendy [editor.]
- Keeves, John [editor.]
- Mansheng, Zhou [editor.]
- Power, Colin [editor.]
- Rajput, J. S [editor.]
- Thaman, Konai Helu [editor.]
- Alagumalai, Sivakumar [editor.]
- Curtis, David D [editor.]
- Hungi, Njora [editor.]
- SpringerLink (Servicio en línea)
Series Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4
Tipo de material:  Texto; Formato:
disponible en línea  ; Forma literaria:
No es ficción Editor: Dordrecht : Springer Netherlands, 2005
Disponibilidad: No hay ítems disponibles.
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