TEST - Catálogo BURRF
   

Force Sensors for Microelectronic Packaging Applications / by Jürg Schwizer, Michael Mayer, Oliver Brand.

Por: Colaborador(es): Tipo de material: TextoTextoSeries Microtechnology and MEMSEditor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005Descripción: viii, 178 páginas 149 ilustraciones recurso en líneaTipo de contenido:
  • texto
Tipo de medio:
  • computadora
Tipo de portador:
  • recurso en línea
ISBN:
  • 9783540269458
Formatos físicos adicionales: Edición impresa:: Sin títuloRecursos en línea:
Contenidos:
Sensor Design -- Measurement System -- Characterization -- Applications -- Conclusions and Outlook.
Resumen: This monograph is intended for wire bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors. New measurement technologies are introduced that allow in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here enables measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.
Valoración
    Valoración media: 0.0 (0 votos)
No hay ítems correspondientes a este registro

Springer eBooks

Sensor Design -- Measurement System -- Characterization -- Applications -- Conclusions and Outlook.

This monograph is intended for wire bonding and flip-chip packaging professionals and for scientists and engineers working in the field of mechanical microsensors. New measurement technologies are introduced that allow in situ and real-time examination of physical processes during the packaging process or during subsequent reliability tests. The measurement system presented here enables measurements at formerly inaccessible packaging interconnects. For the first time it becomes possible to describe the wire bonding process window in terms of the physical forces at the contact zone instead of the applied machine settings. This is significant for a deeper understanding of these packaging processes. Applications of the sensor in the field of wire bonding and flip-chip characterization are illustrated. The reader will gain much insight into the important field of interconnection technology in semiconductor packaging.

Para consulta fuera de la UANL se requiere clave de acceso remoto.

Universidad Autónoma de Nuevo León
Secretaría de Extensión y Cultura - Dirección de Bibliotecas @
Soportado en Koha