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001 277588
003 MX-SnUAN
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007 cr nn 008mamaa
008 150903s2007 xxu| o |||| 0|eng d
020 _a9780387396200
_99780387396200
024 7 _a10.1007/9780387396200
_2doi
035 _avtls000331426
039 9 _a201509030730
_bVLOAD
_c201404121838
_dVLOAD
_c201404091606
_dVLOAD
_c201401311414
_dstaff
_y201401301209
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aT174.7
100 1 _aZhou, Weilie.
_eeditor.
_9300483
245 1 0 _aScanning Microscopy for Nanotechnology :
_bTechniques and Applications /
_cedited by Weilie Zhou, Zhong Lin Wang.
264 1 _aNew York, NY :
_bSpringer New York,
_c2007.
300 _axiv, 522 páginas,
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _aFundamentals of Scanning Electron Microscopy (SEM) -- Backscattering Detector and EBSD in Nanomaterials Characterization -- X-ray Microanalysis in Nanomaterials -- Low kV Scanning Electron Microscopy -- E-beam Nanolithography Integrated with Scanning Electron Microscope -- Scanning Transmission Electron Microscopy for Nanostructure Characterization -- to In-Situ Nanomanipulation for Nanomaterials Engineering -- Applications of FIB and DualBeam for Nanofabrication -- Nanowires and Carbon Nanotubes -- Photonic Crystals and Devices -- Nanoparticles and Colloidal Self-assembly -- Nano-building Blocks Fabricated through Templates -- One-dimensional Wurtzite Semiconducting Nanostructures -- Bio-inspired Nanomaterials -- Cryo-Temperature Stages in Nanostructural Research.
520 _aScanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aWang, Zhong Lin.
_eeditor.
_9300484
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9780387333250
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-39620-0
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c277588
_d277588