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008 150903s2006 xxu| o |||| 0|eng d
020 _a9780387346090
_99780387346090
024 7 _a10.1007/0387346090
_2doi
035 _avtls000331183
039 9 _a201509030713
_bVLOAD
_c201404120615
_dVLOAD
_c201404090355
_dVLOAD
_c201401311406
_dstaff
_y201401301203
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTK7888.4
100 1 _aSilva, Francisco.
_eautor
_9301263
245 1 4 _aThe Core Test Wrapper Handbook :
_bRationale and Application of IEEE Std. 1500™ /
_cby Francisco Silva, Teresa McLaurin, Tom Waayers.
264 1 _aBoston, MA :
_bSpringer US,
_c2006.
300 _axxIx, 276 páginas,
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
490 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v35
500 _aSpringer eBooks
505 0 _aWhat is the IEEE 1500 Standard? -- Why use the IEEE 1500 Standard? -- Illustration Example -- Design of the IEEE 1500 Interface Port -- Instruction Types -- Design of the WBR -- Design of the WBY -- Design of the WIR -- Hierarchical Cores -- Finalizing the Wrapper Solution for the EX Core -- SOC Integration of 1500 Compliant Cores.
520 _aThe Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the design of this IEEE standard conceived to enable efficient core test reuse and debug at the SOC level. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM focuses on practical design considerations and design choices inherent to the application of IEEE Std. 1500. This book teaches an engineer how to add a 1500 wrapper to their core in easy to understand steps. Starting with a bare core (a core without 1500 wrapper), the book progressively builds a 1500 compliant wrapper around this core while discussing overall requirements for each portion of the 1500 wrapper. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM is a very valuable reference for professionals and researchers in the areas of design for test, design for test reuse/design reuse, and SOC implementation.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aMcLaurin, Teresa.
_eautor
_9301264
700 1 _aWaayers, Tom.
_eautor
_9301265
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9780387307510
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/0-387-34609-0
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999 _c277991
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