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020 _a9780387286686
_9978-0-387-28668-6
024 7 _a10.1007/9780387286686
_2doi
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039 9 _a201509030439
_bVLOAD
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100 1 _aKalinin, Sergei.
_eeditor.
_9302053
245 1 0 _aScanning Probe Microscopy :
_bElectrical and Electromechanical Phenomena at the Nanoscale /
_cedited by Sergei Kalinin, Alexei Gruverman.
264 1 _aNew York, NY :
_bSpringer New York,
_c2007.
300 _aXL, 980 páginas, (2-volume-set, not available separately).
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _aSPM Techniques for Electrical Characterization -- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport -- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy -- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics -- Principles of Kelvin Probe Force Microscopy -- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy -- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy -- Principles of Near-Field Microwave Microscopy -- Electromagnetic Singularities and Resonances in Near-Field Optical Probes -- Electrochemical SPM -- Near-Field High-Frequency Probing -- Electrical and Electromechanical Imaging at the Limits of Resolution -- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors -- Spin-Polarized Scanning Tunneling Microscopy -- Scanning Probe Measurements of Electron Transport in Molecules -- Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices -- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks -- Theory of Scanning Probe Microscopy -- Multi-Probe Scanning Tunneling Microscopy -- Dynamic Force Microscopy and Spectroscopy in Vacuum -- Scanning Tunneling Microscopy and Spectroscopy of Manganites -- Electrical SPM Characterization of Materials and Devices -- Scanning Voltage Microscopy -- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces -- Electromechanical Behavior in Biological Systems at the Nanoscale -- Scanning Capacitance Microscopy -- Kelvin Probe Force Microscopy of Semiconductors -- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy -- Electron Flow Through Molecular Structures -- Electrical Characterization of Perovskite Nanostructures by SPM -- SPM Measurements of Electric Properties of Organic Molecules -- High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices -- Electrical Nanofabrication -- Electrical SPM-Based Nanofabrication Techniques -- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation -- UHV-STM Nanofabrication on Silicon -- Ferroelectric Lithography -- Patterned Self-Assembled Monolayers via Scanning Probe Lithography -- Resistive Probe Storage: Read/Write Mechanism.
520 _aScanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aGruverman, Alexei.
_eeditor.
_9302054
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9780387286679
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-28668-6
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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