000 02432nam a22003495i 4500
001 278500
003 MX-SnUAN
005 20160429153906.0
007 cr nn 008mamaa
008 150903s2005 xxu| o |||| 0|eng d
020 _a9780387260167
_9978-0-387-26016-7
024 7 _a10.1007/b136495
_2doi
035 _avtls000330234
039 9 _a201509031113
_bVLOAD
_c201405070504
_dVLOAD
_c201401311334
_dstaff
_c201401311158
_dstaff
_y201401291450
_zstaff
_wmsplit0.mrc
_x654
050 4 _aTA404.6
100 1 _aEgerton, Ray F.
_eautor
_9302175
245 1 0 _aPhysical Principles of Electron Microscopy :
_bAn Introduction to TEM, SEM, and AEM /
_cby Ray F. Egerton.
264 1 _aBoston, MA :
_bSpringer US :
_bImprint: Springer,
_c2005.
300 _aXII, 202 páginas, 122 illus.
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _aAn Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Recent Developments.
520 _aScanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9780387258003
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/b136495
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c278500
_d278500