000 03521nam a22003735i 4500
001 279207
003 MX-SnUAN
005 20160429153936.0
007 cr nn 008mamaa
008 150903s2008 xxu| o |||| 0|eng d
020 _a9780387747477
_99780387747477
024 7 _a10.1007/9780387747477
_2doi
035 _avtls000332535
039 9 _a201509030230
_bVLOAD
_c201404122156
_dVLOAD
_c201404091927
_dVLOAD
_y201402041031
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTK7888.4
100 1 _aTehranipoor, Mohammad.
_eeditor.
_9303229
245 1 0 _aEmerging Nanotechnologies :
_bTest, Defect Tolerance, and Reliability /
_cedited by Mohammad Tehranipoor.
264 1 _aBoston, MA :
_bSpringer US,
_c2008.
300 _brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
490 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v37
500 _aSpringer eBooks
505 0 _aTest and Defect Tolerance for Crossbar-Based Architectures -- Defect-Tolerant Logic with Nanoscale Crossbar Circuits -- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics -- Test and Defect Tolerance for Reconfigurable Nanoscale Devices -- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology -- Defect Tolerance in Crossbar Array Nano-Architectures -- Test and Defect Tolerance for QCA Circuits -- Reversible and Testable Circuits for Molecular QCA Design -- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems -- QCA Circuits for Robust Coplanar Crossing -- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata -- Testing Microfluidic Biochips -- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems -- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips -- Reliability for Nanotechnology Devices -- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields -- Towards Nanoelectronics Processor Architectures -- Design and Analysis of Fault-Tolerant Molecular Computing Systems.
520 _aEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9780387747460
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-74747-7
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999 _c279207
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