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001			279359
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007			cr nn 008mamaa
008			150903s2009 xxu| o |||| 0|eng d
020			_a9780387765013 _99780387765013
024	7		_a10.1007/9780387765013 _2doi
035			_avtls000332686
039		9	_a201509030235 _bVLOAD _c201404122225 _dVLOAD _c201404091956 _dVLOAD _y201402041035 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTA404.6
100	1		_aWilliams, David B. _eautor _9303642
245	1	0	_aTransmission Electron Microscopy : _bA Textbook for Materials Science / _cby David B. Williams, C. Barry Carter.
250			_a2.
264		1	_aBoston, MA : _bSpringer US, _c2009.
300			_a760 páginas 694 ilustraciones, 494 ilustraciones en color. _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aBasics -- The Transmission Electron Microscope -- Scattering and Diffraction -- Elastic Scattering -- Inelastic Scattering and Beam Damage -- Electron Sources -- Lenses, Apertures, and Resolution -- How to ‘See’ Electrons -- Pumps and Holders -- The Instrument -- Specimen Preparation -- Diffraction -- Diffraction in TEM -- Thinking in Reciprocal Space -- Diffracted Beams -- Bloch Waves -- Dispersion Surfaces -- Diffraction from Crystals -- Diffraction from Small Volumes -- Obtaining and Indexing Parallel-Beam Diffraction Patterns -- Kikuchi Diffraction -- Obtaining CBED Patterns -- Using Convergent-Beam Techniques -- Imaging -- Amplitude Contrast -- Phase-Contrast Images -- Thickness and Bending Effects -- Planar Defects -- Imaging Strain Fields -- Weak-Beam Dark-Field Microscopy -- High-Resolution TEM -- Other Imaging Techniques -- Image Simulation -- Processing and Quantifying Images -- Spectrometry -- X-ray Spectrometry -- X-ray Spectra and Images -- Qualitative X-ray Analysis and Imaging -- Quantitative X-ray Analysis -- Spatial Resolution and Minimum Detection -- Electron Energy-Loss Spectrometers and Filters -- Low-Loss and No-Loss Spectra and Images -- High Energy-Loss Spectra and Images -- Fine Structure and Finer Details.
520			_aThis groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance for successful hands-on application of this versatile and powerful materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 for self-assessment and over 400 that are suitable for homework assignment. Key Features: Undisputed market leader, now completely revised and updated Ideal for use as a teaching text at the advanced undergraduate and graduate levels and as a hands-on reference for materials scientists Explains why a particular technique should be used and how a specific concept can be put into practice Nearly 700 figures and diagrams, most in full color Praise for the first edition: `The best textbook for this audience available.' – American Scientist "...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" – Microscopy and Microanalysis `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aCarter, C. Barry. _eautor _9303643
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9780387765006
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-76501-3 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c279359 _d279359