000			03084nam a22003735i 4500
001			279401
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007			cr nn 008mamaa
008			150903s2008 xxu| o |||| 0|eng d
020			_a9780387745145 _99780387745145
024	7		_a10.1007/9780387745145 _2doi
035			_avtls000332503
039		9	_a201509030230 _bVLOAD _c201404122150 _dVLOAD _c201404091920 _dVLOAD _y201402041030 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTK7800-8360
100	1		_aVashchenko, V. A. _eautor _9303698
245	1	0	_aPhysical Limitations of Semiconductor Devices / _cby V. A. Vashchenko, V. F. Sinkevitch.
264		1	_aBoston, MA : _bSpringer US, _c2008.
300			_brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aFailures of Semiconductor Device -- Theoretical Basis of Current Instability in Transistor Structures -- Thermal Instability Mechanism -- Isothermal Current Instability in Silicon BJT and MOSFETs -- Isothermal Instability in Compound Semiconductor Devices -- Degradation Instabilities -- Conductivity Modulation in ESD devices -- Physical Approach to Reliability.
520			_aPhysical Limitations of Semiconductor Devices provides an in depth understanding of the phenomena and regularities that play a critical role in the limitation of semiconductor device capabilities. It discusses how thermo-electrical breakdown, conductivity modulation, and electrical and spatial current instability phenomena affect the limitations of the devices. The authors give examples of the phenomena ranging from elementary semiconductor diode structures to discrete power and integrated components. They also show circuits both for silicon and compound semiconductor devices. The material covers different levels of complexity including phenomenological, analytical, and numerical simulation. The material also explores the most complex phenomena of current filamentation and the impact of local structure defects, physical safe operating area limitations, and various scenarios of catastrophic failures in semiconductor devices. The emphasis of the book is on the physical approach to reliability assurance, safe operating area, and ESD problems. Physical Limitations of Semiconductor Devices provides an important link between the theoretical aspects of the physics of semiconductor devices, non-linear physics, and the practical applications of microelectronics.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aSinkevitch, V. F. _eautor _9303699
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9780387745138
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-74514-5 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c279401 _d279401