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008 150903s2007 xxu| o |||| 0|eng d
020 _a9780387717548
_99780387717548
024 7 _a10.1007/9780387717548
_2doi
035 _avtls000332185
039 9 _a201509030217
_bVLOAD
_c201404122045
_dVLOAD
_c201404091815
_dVLOAD
_y201402041022
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTK5102.9
100 1 _aAliev, Telman.
_eautor
_9304323
245 1 0 _aDigital Noise Monitoring of Defect Origin /
_cby Telman Aliev.
264 1 _aBoston, MA :
_bSpringer US,
_c2007.
300 _brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _aDifficulties of Monitoring a Defect at Its Origin and Its Dataware Features -- Position-Binary Technology of Monitoring Defect at its Origin -- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin -- Robust Correlation Monitoring of a Defect at its Origin -- Spectral Monitoring of a Defect's Origin -- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier -- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.
520 _aDigital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9780387717531
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-71754-8
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c279798
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