000			03385nam a22003855i 4500
001			279830
003			MX-SnUAN
005			20160429153959.0
007			cr nn 008mamaa
008			150903s2008 xxu| o |||| 0|eng d
020			_a9780387690117 _99780387690117
024	7		_a10.1007/9780387690117 _2doi
035			_avtls000331975
039		9	_a201509030733 _bVLOAD _c201404122001 _dVLOAD _c201404091728 _dVLOAD _y201402041017 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTK7888.4
100	1		_aOrshansky, Michael. _eautor _9304368
245	1	0	_aDesign for Manufacturability and Statistical Design : _bA Constructive Approach / _cby Michael Orshansky, Sani R. Nassif, Duane Boning.
264		1	_aBoston, MA : _bSpringer US, _c2008.
300			_brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aSources of Variability -- Front End Variability -- Back End Variability -- Environmental Variability -- Variability Characterization and Analysis -- Test Structures For Variability -- Statistical Foundations Of Data Analysis And Modeling -- Design Techniques for Systematic Manufacturability Problems -- Lithography Enhancement Techniques -- Ensuring Interconnect Planarity -- Statistical Circuit Design -- Statistical Circuit Analysis -- Statistical Static Timing Analysis -- Leakage Variability And Joint Parametric Yield -- Parametric Yield Optimization -- Conclusions.
520			_aDesign for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to understanding the causes of variability; design of test structures for variability characterization; statistically rigorous data analysis; techniques of design for manufacturability in lithography and in chemical mechanical polishing; statistical simulation, analysis, and optimization techniques for improving parametric yield. Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aNassif, Sani R. _eautor _9304369
700	1		_aBoning, Duane. _eautor _9304370
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9780387309286
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-69011-7 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c279830 _d279830