000			03494nam a22004095i 4500
001			280540
003			MX-SnUAN
005			20160429154028.0
007			cr nn 008mamaa
008			150903s2011 xxk| o |||| 0|eng d
020			_a9780857295439 _99780857295439
024	7		_a10.1007/9780857295439 _2doi
035			_avtls000333920
039		9	_a201509030242 _bVLOAD _c201404130559 _dVLOAD _c201404092348 _dVLOAD _y201402041135 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTJ241
100	1		_aFranceschini, Fiorenzo. _eautor _9305528
245	1	0	_aDistributed Large-Scale Dimensional Metrology : _bNew Insights / _cby Fiorenzo Franceschini, Maurizio Galetto, Domenico Maisano, Luca Mastrogiacomo, Barbara Pralio.
264		1	_aLondon : _bSpringer London, _c2011.
300			_axvI, 233 páginas 118 ilustraciones _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_a1. LSM: The New Paradigm of Distributed Systems -- 2. Indoor GPS (iGPSTM) -- 3. The Mobile Spatial coordinate Measuring System (MScMS) -- 4. Positioning and Coverage of Distributed Devices -- 5. System Calibration -- 6. Self-Diagnostic Tools -- 7. Methodologies for Performance Enhancing -- 8. Evaluation of Measurement Uncertainty.
520			_aThe field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large-scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aGaletto, Maurizio. _eautor _9305529
700	1		_aMaisano, Domenico. _eautor _9305530
700	1		_aMastrogiacomo, Luca. _eautor _9305531
700	1		_aPralio, Barbara. _eautor _9305532
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9780857295422
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-85729-543-9 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c280540 _d280540