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008			150903s2010 xxu| o |||| 0|eng d
020			_a9780387981826 _99780387981826
024	7		_a10.1007/9780387981826 _2doi
035			_avtls000333453
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040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTA404.6
100	1		_aAyache, Jeanne. _eautor _9305874
245	1	0	_aSample Preparation Handbook for Transmission Electron Microscopy : _bMethodology / _cby Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2010.
300			_axxiii, 250 páginas 114 ilustraciones _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aMethodology: General Introduction -- to Materials -- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM) -- Materials Problems and Approaches for TEM and TEM/STEM Analyses -- Physical and Chemical Mechanisms of Preparation Techniques -- Artifacts in Transmission Electron Microscopy -- Selection of Preparation Techniques Based on Material Problems and TEM Analyses -- Comparisons of Techniques -- Conclusion: What Is a Good Sample?.
520			_aThis two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy http://temsamprep.in2p3.fr/
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aBeaunier, Luc. _eautor _9305875
700	1		_aBoumendil, Jacqueline. _eautor _9305876
700	1		_aEhret, Gabrielle. _eautor _9305877
700	1		_aLaub, Danièle. _eautor _9305878
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9780387981819
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-98182-6 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c280734 _d280734