000			04698nam a22003975i 4500
001			281001
003			MX-SnUAN
005			20160429154046.0
007			cr nn 008mamaa
008			150903s2009 xxu| o |||| 0|eng d
020			_a9780387881362 _99780387881362
024	7		_a10.1007/9780387881362 _2doi
035			_avtls000333210
039		9	_a201509030801 _bVLOAD _c201404130356 _dVLOAD _c201404092144 _dVLOAD _y201402041105 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTA401-492
100	1		_aSchwartz, Adam J. _eeditor. _9306320
245	1	0	_aElectron Backscatter Diffraction in Materials Science / _cedited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field.
264		1	_aBoston, MA : _bSpringer US, _c2009.
300			_axxii, 403 páginas _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aPresent State of Electron Backscatter Diffraction and Prospective Developments -- Dynamical Simulation of Electron Backscatter Diffraction Patterns -- Representations of Texture -- Energy Filtering in EBSD -- Spherical Kikuchi Maps and Other Rarities -- Application of Electron Backscatter Diffraction to Phase Identification -- Phase Identification Through Symmetry Determination in EBSD Patterns -- Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping in a FIB-SEM -- Collection, Processing, and Analysis of Three-Dimensional EBSD Data Sets -- 3D Reconstruction of Digital Microstructures -- Direct 3D Simulation of Plastic Flow from EBSD Data -- First-Order Microstructure Sensitive Design Based on Volume Fractions and Elementary Bounds -- Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations -- Combinatorial Materials Science and EBSD: A High Throughput Experimentation Tool -- Grain Boundary Networks -- Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections -- Strain Mapping Using Electron Backscatter Diffraction -- Mapping and Assessing Plastic Deformation Using EBSD -- Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques -- Application of EBSD Methods to Severe Plastic Deformation (SPD) and Related Processing Methods -- Applications of EBSD to Microstructural Control in Friction Stir Welding/Processing -- Characterization of Shear Localization and Shock Damage with EBSD -- Texture Separation for ?/? Titanium Alloys -- A Review of In Situ EBSD Studies -- Electron Backscatter Diffraction in Low Vacuum Conditions -- EBSD in the Earth Sciences: Applications, Common Practice, and Challenges -- Orientation Imaging Microscopy in Research on High Temperature Oxidation.
520			_aElectron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aKumar, Mukul. _eeditor. _9306321
700	1		_aAdams, Brent L. _eeditor. _9306322
700	1		_aField, David P. _eeditor. _9306323
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9780387881355
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-0-387-88136-2 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c281001 _d281001