000 02513nam a22004095i 4500
001 282716
003 MX-SnUAN
005 20160429154203.0
007 cr nn 008mamaa
008 150903s2006 ne | o |||| 0|eng d
020 _a9781402053153
_99781402053153
024 7 _a10.1007/1402053150
_2doi
035 _avtls000335128
039 9 _a201509030251
_bVLOAD
_c201404120924
_dVLOAD
_c201404090702
_dVLOAD
_y201402041252
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTK7888.4
100 1 _aSánchez, Gloria Huertas.
_eautor
_9309674
245 1 0 _aOscillation-Based Test in Mixed-Signal Circuits /
_cby Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz.
264 1 _aDordrecht :
_bSpringer Netherlands,
_c2006.
300 _axv, 452 páginas
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
490 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v36
500 _aSpringer eBooks
505 0 _aOscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation.
520 _aOscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aGarcía de la Vega, Diego Vázquez.
_eautor
_9309675
700 1 _aRueda, Adoración Rueda.
_eautor
_9309676
700 1 _aDíaz, José Luis Huertas.
_eautor
_9309677
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9781402053146
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/1-4020-5315-0
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c282716
_d282716