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020 _a9781402080067
_99781402080067
024 7 _a10.1007/1402080069
_2doi
035 _avtls000335866
039 9 _a201509030204
_bVLOAD
_c201404120938
_dVLOAD
_c201404090716
_dVLOAD
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_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
100 1 _aYao, Nan.
_eeditor.
_9310989
245 1 0 _aHandbook of Microscopy for Nanotechnology /
_cedited by Nan Yao, Zhong Lin Wang.
264 1 _aBoston, MA :
_bSpringer US,
_c2005.
300 _axx, 731 páginas
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _aOptical Microscopy, Scanning Probe Microscopy, Ion Microscopy and Nanofabrication -- Confocal Scanning Optical Microscopy and Nanotechnology -- Scanning Near-Field Optical Microscopy in Nanosciences -- Scanning Tunneling Microscopy -- Visualization of Nanostructures with Atomic Force Microscopy -- Scanning Probe Microscopy for Nanoscale Manipulation and Patterning -- Scanning Thermal and Thermoelectric Microscopy -- Imaging Secondary Ion Mass Spectrometry -- Atom Probe Tomography -- Focused Ion Beam System—a Multifunctional Tool for Nanotechnology -- Electron Beam Lithography -- Electron Microscopy -- High-Resolution Scanning Electron Microscopy -- High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials -- Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope -- High Resolution Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy -- In-Situ Electron Microscopy for Nanomeasurements -- Environmental Transmission Electron Microscopy in Nanotechnology -- Electron Nanocrystallography -- Tomography Using the Transmission Electron Microscope -- Off-Axis Electron Holography -- SUB-NM Spatially Resolved Electron Energy-Loss Spectroscopy -- Imaging Magnetic Structures Using TEM.
520 _aNanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aWang, Zhong Lin.
_eeditor.
_9300484
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9781402080036
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/1-4020-8006-9
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c283459
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