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008 150903s2011 xxu| o |||| 0|eng d
020 _a9781441969934
_99781441969934
024 7 _a10.1007/9781441969934
_2doi
035 _avtls000338820
039 9 _a201509030310
_bVLOAD
_c201404300351
_dVLOAD
_y201402060919
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTK7888.4
100 1 _aNicolaidis, Michael.
_eeditor.
_9313065
245 1 0 _aSoft Errors in Modern Electronic Systems /
_cedited by Michael Nicolaidis.
264 1 _aBoston, MA :
_bSpringer US :
_bImprint: Springer,
_c2011.
300 _axviii, 318 páginas
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
490 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v41
500 _aSpringer eBooks
505 0 _aSoft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends -- Radiation Induced Single-Event Effects: Physical Mechanisms and Classification -- JEDEC Standard on Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors -- Cell-Level Modelling and Simulation -- Circuit and System Level Modelling and Simulation -- Hardware Fault Injection -- Accelerated Radiation Testing for Space Applications -- Testing for Ground-Level Applications -- Soft Error Mitigation Techniques -- Convergence of Mitigation Techniques for Soft Errors and Other Reliability Issues and Power Aware Mitigation Techniques -- Software Level Soft-Error Mitigation Techniques -- System Level Soft-Error Mitigation Techniques.
520 _aSoft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9781441969927
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4419-6993-4
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999 _c284999
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