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020 _a9781441971678
_99781441971678
024 7 _a10.1007/9781441971678
_2doi
035 _avtls000338869
039 9 _a201509030310
_bVLOAD
_c201404300351
_dVLOAD
_y201402060921
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTA404.6
100 1 _aKalinin, Sergei V.
_eeditor.
_9313127
245 1 0 _aScanning Probe Microscopy of Functional Materials :
_bNanoscale Imaging and Spectroscopy /
_cedited by Sergei V. Kalinin, Alexei Gruverman.
264 1 _aNew York, NY :
_bSpringer New York,
_c2011.
300 _axviii, 600 páginas 277 ilustraciones, 219 ilustraciones en color.
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _aI. Emergent phenomena in strongly-correlated systems: Phase separation and novel quaziparticles in nanowires -- STM of ruthenates and manganites -- STM of superconductors -- STM of cuprates -- II. Semiconductor and photovoltaic materials: SPM of solar materials -- Cross-sectional STM of semiconductor heterostructures -- Charge dynamics in photovoltaic polymers -- III. Functional probing of biosystems and macromolecules: Molecular Imaging of biomembranes single molecules with electrically functionalized probes -- AFM/patch clamp in biology -- Electrical imaging of membranes -- Cell dynamics by Ion conductance microscopy -- Ferroelectric polymers -- IV. SPM of magnetic materials: Spin manipulation by STM -- Magnetic Resonant Force Microscopy -- Magnetic Force Microscopy -- V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: New dynamic modes and energy dissipation in SPM -- Polarization dynamics in relaxor ferroelectrics -- Piezoresponse Force Spectroscopy -- Polarization dynamics in capacitors and heterostructures -- VI. Mechanical properties: Nanomechanics by SPM -- Atomic Force Acoustic Microscopy of functional materials -- VII. Optical methods: NSOM and NSOM-transport -- NSOM -- Optical machines and unfolding -- Optically-assisted pump-probe STM -- VIII. Emerging SPM applications: STM/NC-AFM -- Scanning Non-linear Dielectric Microscopy -- Vibrational spectroscopy of single molecule -- Ultrafast ac STM -- SPM and electron microscopy combined -- In-situ STEM-nanoindentation -- Material characterization by SPM-focused X-ray combination -- *see Long ToC for tentative contributors.
520 _aNovel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aGruverman, Alexei.
_eeditor.
_9302054
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9781441965677
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4419-7167-8
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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