000			03392nam a22004095i 4500
001			286194
003			MX-SnUAN
005			20160429154448.0
007			cr nn 008mamaa
008			150903s2010 xxu| o |||| 0|eng d
020			_a9781441959751 _99781441959751
024	7		_a10.1007/9781441959751 _2doi
035			_avtls000338536
039		9	_a201509030812 _bVLOAD _c201404300346 _dVLOAD _y201402060912 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTA404.6
100	1		_aAyache, Jeanne. _eautor _9305874
245	1	0	_aSample Preparation Handbook for Transmission Electron Microscopy : _bTechniques / _cby Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2010.
300			_axxv, 338 páginas _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aTechniques: General Introduction -- Preliminary Preparation Techniques -- Thinning Preparation Techniques -- Mechanical Preparation Techniques -- Replica Techniques -- Techniques Specific to Fine Particles -- Contrast Enhancement and Labeling Techniques.
520			_aThis two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy *http://temsamprep.in2p3.fr/
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aBeaunier, Luc. _eautor _9305875
700	1		_aBoumendil, Jacqueline. _eautor _9305876
700	1		_aEhret, Gabrielle. _eautor _9305877
700	1		_aLaub, Danièle. _eautor _9305878
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9781441959744
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4419-5975-1 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c286194 _d286194