000 03338nam a22003975i 4500
001 287393
003 MX-SnUAN
005 20160429154545.0
007 cr nn 008mamaa
008 150903s2011 xxk| o |||| 0|eng d
020 _a9781447121671
_99781447121671
024 7 _a10.1007/9781447121671
_2doi
035 _avtls000339506
039 9 _a201509030838
_bVLOAD
_c201404300401
_dVLOAD
_y201402060937
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTJ241
100 1 _aZhao, Yaoyao (Fiona).
_eautor
_9316544
245 1 0 _aInformation Modeling for Interoperable Dimensional Metrology /
_cby Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu.
264 1 _aLondon :
_bSpringer London,
_c2011.
300 _axIx, 367 páginas 146 ilustraciones
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _a1. Introduction -- 2. Practices of Information Modeling -- 3. Product Definition and Dimensional Metrology Systems -- 4. High-Level Dimensional Metrology Process Planning -- 5. Low-Level Dimensional Metrology Process Planning and Execution -- 6. Quality Data Analysis and Reporting -- 7. Dimensional Metrology Interoperability Issues -- 8. Dimensional Metrology for Manufacturing Quality Control -- 9. Outlook for the Future of Dimensional Metrology Systems Interoperability.
520 _aDimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity. Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems. Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices. 
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aBrown, Robert.
_eautor
_9313427
700 1 _aKramer, Thomas R.
_eautor
_9316545
700 1 _aXu, Xun.
_eautor
_9316546
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9781447121664
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4471-2167-1
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c287393
_d287393