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008			150903s2012 xxu| o |||| 0|eng d
020			_a9781441982971 _99781441982971
024	7		_a10.1007/9781441982971 _2doi
035			_avtls000339201
039		9	_a201509030837 _bVLOAD _c201404300356 _dVLOAD _y201402060929 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTK7888.4
100	1		_aTehranipoor, Mohammad. _eautor _9303229
245	1	0	_aTest and Diagnosis for Small-Delay Defects / _cby Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty.
264		1	_aNew York, NY : _bSpringer New York, _c2012.
300			_axvI, 212 páginas 114 ilustraciones _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aIntroduction to VLSI Testing -- Delay Test and System-Delay Defects -- Long Path-Based Hybrid Method -- Process Variations- and Crosstalk-Aware Pattern Selection -- Power Supply Noise- and Crosstalk-Aware Hybrid Method -- SDD-Based Hybrid Method -- Maximizing Crosstalk Effect on Critical Paths -- Maximizing Power Supply Noise on Critical Paths -- Faster-than-at-speed Test -- Introduction to Diagnosis -- Diagnosing Noise-Induced SDDs by Using Dynamic SDF. .
520			_aThis book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. This book presents new techniques and methodologies to improve overall SDD detection with very small pattern sets. These methods can result in pattern counts as low as a traditional 1-detect pattern set and long path sensitization and SDD detection similar to or even better than n-detect or timing-aware pattern sets. The important design parameters and pattern-induced noises such as process variations,power supply noise (PSN) and crosstalk are taken into account in the methodologies presented. A diagnostic flow is also presented to identify whether the failure is caused by PSN, crosstalk, or a combination of these two effects. * Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects; * Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologies; * Shows readers to use timing information for small-delay defect diagnosis, in order to increase the resolution of their current diagnosis flow.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aPeng, Ke. _eautor _9316830
700	1		_aChakrabarty, Krishnendu. _eautor _9308758
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9781441982964
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4419-8297-1 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c287584 _d287584