000			02782nam a22003975i 4500
001			288277
003			MX-SnUAN
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007			cr nn 008mamaa
008			150903s2013 xxu| o |||| 0|eng d
020			_a9781461444725 _99781461444725
024	7		_a10.1007/9781461444725 _2doi
035			_avtls000341321
039		9	_a201509030829 _bVLOAD _c201405050227 _dVLOAD _y201402061056 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aHD30.23
100	1		_aMönch, Lars. _eautor _9317915
245	1	0	_aProduction Planning and Control for Semiconductor Wafer Fabrication Facilities : _bModeling, Analysis, and Systems / _cby Lars Mönch, John W. Fowler, Scott J. Mason.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2013.
300			_axii, 288 páginas 46 ilustraciones, 22 ilustraciones en color. _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
490	0		_aOperations Research/Computer Science Interfaces Series, _x1387-666X ; _v52
500			_aSpringer eBooks
505	0		_aIntroduction -- Semiconductor Manufacturing Process Description -- Modeling and Analysis Tools -- Dispatching Approaches -- Deterministic Scheduling Approaches -- Order Release Approaches -- Production Planning Approaches -- Production Planning and Control Systems.
520			_aOver the last fifty-plus years, the increased complexity and speed of integrated circuits have radically changed our world. Today, semiconductor manufacturing is perhaps the most important segment of the global manufacturing sector. As the semiconductor industry has become more competitive, improving planning and control has become a key factor for business success. This book is devoted to production planning and control problems in semiconductor wafer fabrication facilities. It is the first book that takes a comprehensive look at the role of modeling, analysis, and related information systems for such manufacturing systems. The book provides an operations research- and computer science-based introduction into this important field of semiconductor manufacturing-related research.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aFowler, John W. _eautor _9317916
700	1		_aMason, Scott J. _eautor _9317917
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9781461444718
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4614-4472-5 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c288277 _d288277