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001			288919
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007			cr nn 008mamaa
008			150903s2012 xxu| o |||| 0|eng d
020			_a9781461434368 _99781461434368
024	7		_a10.1007/9781461434368 _2doi
035			_avtls000340998
039		9	_a201509030828 _bVLOAD _c201404300423 _dVLOAD _y201402061049 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTA404.6
100	1		_aGault, Baptiste. _eautor _9318881
245	1	0	_aAtom Probe Microscopy / _cby Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2012.
300			_axxiii, 396 páginas 194 ilustraciones, 116 ilustraciones en color. _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
490	0		_aSpringer Series in Materials Science, _x0933-033X ; _v160
500			_aSpringer eBooks
505	0		_aPreface -- Acknowledgements -- List of Acronyms and Abbreviations -- List of Terms -- List of Non-SI Units and Constant Values -- PART I Fundamentals -- 1. Introduction -- 2. Field Ion Microscopy -- 3 From Field Desorption Microscopy to Atom Probe Tomography -- Part II Practical aspects -- 4. Specimen Preparation -- 5. Experimental protocols in Field Ion Microscopy -- 6. Experimental protocols -- 7. Tomographic reconstruction -- PART III Applying atom probe techniques for materials science -- 8. Analysis techniques for atom probe tomography -- 9. Atom probe microscopy and materials science -- Appendices.
520			_aAtom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques Presents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aMoody, Michael P. _eautor _9318882
700	1		_aCairney, Julie M. _eautor _9318883
700	1		_aRinger, Simon P. _eautor _9318884
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9781461434351
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4614-3436-8 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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