000			02952nam a22003855i 4500
001			289069
003			MX-SnUAN
005			20160429154655.0
007			cr nn 008mamaa
008			150903s2014 xxu| o |||| 0|eng d
020			_a9781461441939 _99781461441939
024	7		_a10.1007/9781461441939 _2doi
035			_avtls000341233
039		9	_a201509030835 _bVLOAD _c201405050225 _dVLOAD _y201402061054 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aTK7888.4
100	1		_aMathew, Jimson. _eeditor. _9319105
245	1	0	_aEnergy-Efficient Fault-Tolerant Systems / _cedited by Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhan.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2014.
300			_axiv, 335 páginas 132 ilustraciones, 51 ilustraciones en color. _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aEvolution of Fault Tolerant Design -- Fault and Reliability Models -- Energy Efficient Design Techniques -- Error Correction Coding -- System-level Reliable Design -- Fault Tolerant -- Finite Field Arithmetic Circuit  Design and  Testing  Techniques -- Reliable Network-on-Chip Architectures -- Energy Efficient Reconfigurable Systems -- Bio-Inspired Online Fault Detection in NoC Interconnect -- Fault-tolerant dynamically reconfigurable NoC-based SoC.
520			_aThis book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems.  It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches.  Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented. ·         Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability; ·         Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches; ·         Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aShafik, Rishad A. _eeditor. _9319106
700	1		_aPradhan, Dhiraj K. _eeditor. _9315831
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9781461441922
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4614-4193-9 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942			_c14
999			_c289069 _d289069