000 02532nam a22003615i 4500
001 290324
003 MX-SnUAN
005 20170705134221.0
007 cr nn 008mamaa
008 150903s2013 xxu| o |||| 0|eng d
020 _a9781461467830
_99781461467830
024 7 _a10.1007/9781461467830
_2doi
035 _avtls000342005
039 9 _a201509030343
_bVLOAD
_c201405050237
_dVLOAD
_y201402061115
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aTK7800-8360
100 1 _aPeeters, Eric.
_eautor
_9320990
245 1 0 _aAdvanced DPA Theory and Practice :
_bTowards the Security Limits of Secure Embedded Circuits /
_cby Eric Peeters.
264 1 _aNew York, NY :
_bSpringer New York :
_bImprint: Springer,
_c2013.
300 _axvI, 139 páginas 70 ilustraciones, 20 ilustraciones en color.
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
500 _aSpringer eBooks
505 0 _aGeneral Introduction -- Side-Channel Cryptanalysis: a brief survey -- CMOS devices: sources and models of emanation -- Measurement of the power consumption -- Electromagnetic Leakage -- Statistical Tools -- Higher Order Attacks -- Towards the Evaluation of an Implementation against Side-Channel Attacks -- General Conclusion and Possible Further Directions.
520 _aAdvanced DPA Theory and Practice provides a thorough survey of new physical leakages of embedded systems, namely the power and the electromagnetic emanations. The book presents a thorough analysis about leakage origin of embedded system. This book examines the systematic approach of the different aspects and advanced details about experimental setup for electromagnetic attack. The author discusses advanced statistical methods to successfully attack embedded devices such as high-order attack, template attack in principal subspaces, machine learning methods. The book includes theoretical framework to define side-channel based on two metrics: mutual information and success rate.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9781461467823
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-1-4614-6783-0
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c290324
_d290324