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008 | 150903s2005 gw | o |||| 0|eng d | ||
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_a9783540279228 _99783540279228 |
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024 | 7 |
_a10.1007/3540279229 _2doi |
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035 | _avtls000347063 | ||
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_a201509030735 _bVLOAD _c201404121326 _dVLOAD _c201404091103 _dVLOAD _y201402070923 _zstaff |
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_aMX-SnUAN _bspa _cMX-SnUAN _erda |
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050 | 4 | _aQC176-176.9 | |
100 | 1 |
_aRein, Stefan. _eautor _9327437 |
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245 | 1 | 0 |
_aLifetime Spectroscopy : _bA Method of Defect Characterization in Silicon for Photovoltaic Applications / _cby Stefan Rein. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2005. |
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300 |
_axxvI, 489 páginas 153 ilustraciones _brecurso en línea. |
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_atexto _btxt _2rdacontent |
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_acomputadora _bc _2rdamedia |
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_arecurso en línea _bcr _2rdacarrier |
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_aarchivo de texto _bPDF _2rda |
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490 | 0 |
_aSpringer Series in Material Science, _x0933-033X ; _v85 |
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500 | _aSpringer eBooks | ||
505 | 0 | _aTheory of carrier lifetime in silicon -- Lifetime measurement techniques -- Theory of lifetime spectroscopy -- Defect characterization on intentionally metal-contaminated silicon samples -- The metastable defect in boron-doped Czochralski silicon -- Summary and further work -- Zusammenfassung und Ausblick. | |
520 | _aLifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. | ||
590 | _aPara consulta fuera de la UANL se requiere clave de acceso remoto. | ||
710 | 2 |
_aSpringerLink (Servicio en línea) _9299170 |
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776 | 0 | 8 |
_iEdición impresa: _z9783540253037 |
856 | 4 | 0 |
_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/3-540-27922-9 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL) |
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