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_a9783540319153 _99783540319153 |
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_a10.1007/3540319158 _2doi |
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| 100 | 1 |
_aCullis, A. G. _eeditor. _9310236 |
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| 245 | 1 | 0 |
_aMicroscopy of Semiconducting Materials : _bProceedings of the 14th Conference, April 11–14, 2005, Oxford, UK / _cedited by A. G. Cullis, J. L. Hutchison. |
| 264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2005. |
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| 300 |
_axvI, 537 páginas 489 ilustraciones _brecurso en línea. |
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| 336 |
_atexto _btxt _2rdacontent |
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| 337 |
_acomputadora _bc _2rdamedia |
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| 338 |
_arecurso en línea _bcr _2rdacarrier |
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| 347 |
_aarchivo de texto _bPDF _2rda |
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| 490 | 0 |
_aSpringer Proceedings in Physics, _x0930-8989 ; _v107 |
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| 500 | _aSpringer eBooks | ||
| 505 | 0 | _aEpitaxy: Wide Band-Gap Nitrides -- Epitaxy: Silicon-Germanium Alloys -- Epitaxy: Growth and Defect Phenomena -- High Resolution Microscopy and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials -- Device Studies -- Scanning Electron and Scanning Probe Advances. | |
| 520 | _aThis is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume. | ||
| 590 | _aPara consulta fuera de la UANL se requiere clave de acceso remoto. | ||
| 700 | 1 |
_aHutchison, J. L. _eeditor. _9328753 |
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| 710 | 2 |
_aSpringerLink (Servicio en línea) _9299170 |
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| 776 | 0 | 8 |
_iEdición impresa: _z9783540319146 |
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_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/3-540-31915-8 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL) |
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