000			02645nam a22003975i 4500
001			300184
003			MX-SnUAN
005			20170705134250.0
007			cr nn 008mamaa
008			150903s2010 gw | o |||| 0|eng d
020			_a9783642024177 _99783642024177
024	7		_a10.1007/9783642024177 _2doi
035			_avtls000353342
039		9	_a201509030515 _bVLOAD _c201405060319 _dVLOAD _y201402180942 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aQC350-467
100	1		_aBreitenstein, Otwin. _eautor _9337432
245	1	0	_aLock-in Thermography : _bBasics and Use for Evaluating Electronic Devices and Materials / _cby Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
264		1	_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2010.
300			_ax, 258 páginas _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
490	0		_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v10
500			_aSpringer eBooks
505	0		_aIntroduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
520			_aThis book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aWarta, Wilhelm. _eautor _9337433
700	1		_aLangenkamp, Martin. _eautor _9337434
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9783642024160
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-3-642-02417-7 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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999			_c300184 _d300184