000 02533nam a22003855i 4500
001 304591
003 MX-SnUAN
005 20160429155910.0
007 cr nn 008mamaa
008 150903s2012 gw | o |||| 0|eng d
020 _a9783642233517
_99783642233517
024 7 _a10.1007/9783642233517
_2doi
035 _avtls000357723
039 9 _a201509030524
_bVLOAD
_c201405070220
_dVLOAD
_y201402191506
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aQC610.9-611.8
100 1 _aPatane, Amalia.
_eeditor.
_9343471
245 1 0 _aSemiconductor Research :
_bExperimental Techniques /
_cedited by Amalia Patane, Naci Balkan.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2012.
300 _axIx, 372 páginas 192 ilustraciones, 38 ilustraciones en color.
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
490 0 _aSpringer Series in Materials Science,
_x0933-033X ;
_v150
500 _aSpringer eBooks
505 0 _aElectron Diffraction: RHEED and LEED -- Transmission Electron Microscopy and Energy-Dispersive X-ray Spectroscopy -- Techniques for Surface Characterization -- Optical Modulation Spectroscopy -- Photoluminescence and Magnetophotoluminescence -- High Pressure Studies -- Microphotoluminescence, Scanning Near-Field Optical Microscopy and Cathodoluminescence -- Time Resolved Optical Spectroscopy -- Raman Spectroscopy -- Cyclotron Resonance -- Transport in High Magnetic Fields -- Photoconductivity -- Hot Carrier Transport.
520 _aThe book describes the fundamentals, latest developments and use of key experimental techniques for semiconductor research. It explains the application potential of various analytical methods and discusses the opportunities to apply particular analytical techniques to study novel semiconductor compounds, such as dilute nitride alloys. The emphasis is on the technique rather than on the particular system studied.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aBalkan, Naci.
_eeditor.
_9343472
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9783642233500
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-3-642-23351-7
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c304591
_d304591