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001 308771
003 MX-SnUAN
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008 150903s2014 gw | o |||| 0|eng d
020 _a9783642375309
_99783642375309
024 7 _a10.1007/9783642375309
_2doi
035 _avtls000361299
039 9 _a201509031031
_bVLOAD
_c201405070312
_dVLOAD
_y201402210944
_zstaff
040 _aMX-SnUAN
_bspa
_cMX-SnUAN
_erda
050 4 _aQC350-467
100 1 _aSuga, Shigemasa.
_eautor
_9348776
245 1 0 _aPhotoelectron Spectroscopy :
_bBulk and Surface Electronic Structures /
_cby Shigemasa Suga, Akira Sekiyama.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg :
_bImprint: Springer,
_c2014.
300 _axviii, 378 páginas 192 ilustraciones, 70 ilustraciones en color.
_brecurso en línea.
336 _atexto
_btxt
_2rdacontent
337 _acomputadora
_bc
_2rdamedia
338 _arecurso en línea
_bcr
_2rdacarrier
347 _aarchivo de texto
_bPDF
_2rda
490 0 _aSpringer Series in Optical Sciences,
_x0342-4111 ;
_v176
500 _aSpringer eBooks
505 0 _aTheoretical Background -- Instrumentation and Methodology -- Bulk and Surface Sensitivity of Photoelectron Spectroscopy -- Examples of Angle Integrated Photoelectron Spectroscopy -- Angle-Resolved Photoelectron Spectroscopy in HV-regions -- High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems -- Very Low Photon Energy Photoelectron Spectroscopy -- Inverse Photoemission -- Photoelectron Diffraction -- Complementary Techniques for Studying Bulk Electronic Structures -- Surface Spectroscopy by Scanning Tunneling Microscope.
520 _aPhotoelectron spectroscopy is now becoming more and more required to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. The energy resolution was much improved in the last decade down to 1 meV in the low photon energy region. Now this technique is available from a few eV up to 10 keV by use of lasers, electron cyclotron resonance lamps in addition to synchrotron radiation and X-ray tubes. High resolution angle resolved photoelectron spectroscopy (ARPES) is now widely applied to band mapping of materials. It attracts a wide attention from both fundamental science and material engineering. Studies of the dynamics of excited states are feasible by time of flight spectroscopy with fully utilizing the pulse structures of synchrotron radiation as well as lasers including the free electron lasers (FEL). Spin resolved studies also made dramatic progress by using higher efficiency spin detectors and two dimensional spin detectors. Polarization dependent measurements in the whole photon energy spectrum of the spectra provide useful information on the symmetry of orbitals. The book deals with the fundamental concepts and approaches for the application of this technique to materials studies. Complementary techniques such as inverse photoemission, photoelectron diffraction, photon spectroscopy including infrared and X-ray and scanning tunneling spectroscopy are presented. This book provides not only a wide scope of photoelectron spectroscopy of solids but also extends our understanding of electronic structures beyond photoelectron spectroscopy.
590 _aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700 1 _aSekiyama, Akira.
_eautor
_9348777
710 2 _aSpringerLink (Servicio en línea)
_9299170
776 0 8 _iEdición impresa:
_z9783642375293
856 4 0 _uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-3-642-37530-9
_zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942 _c14
999 _c308771
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