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001			314013
003			MX-SnUAN
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007			cr nn 008mamaa
008			150903s2012 ne | o |||| 0|eng d
020			_a9789400755802 _99789400755802
024	7		_a10.1007/9789400755802 _2doi
035			_avtls000367607
039		9	_a201509030716 _bVLOAD _c201405070444 _dVLOAD _y201402251628 _zstaff
040			_aMX-SnUAN _bspa _cMX-SnUAN _erda
050		4	_aQD901-999
100	1		_aKolb, Ute. _eeditor. _9356459
245	1	0	_aUniting Electron Crystallography and Powder Diffraction / _cedited by Ute Kolb, Kenneth Shankland, Louisa Meshi, Anatoly Avilov, William I.F David.
264		1	_aDordrecht : _bSpringer Netherlands : _bImprint: Springer, _c2012.
300			_axiii, 434 páginas _brecurso en línea.
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
490	0		_aNATO Science for Peace and Security Series B: Physics and Biophysics, _x1874-6500
500			_aSpringer eBooks
505	0		_aPreface -- Part 1 – Powder Diffraction -- Powder Diffraction: By Decades -- Rietveld Refinement -- Structure Solution - an Overview -- Inorganic Materials -- Organic Compounds -- Laboratory X-ray Diffraction -- Synchrotron X-Ray Powder Diffraction -- Ultra Fast Powder Diffraction -- Taking it to Extremes – Powder Diffraction at Elevated Pressures.-Structure Solution by Charge Flipping -- Structure Solution: Global Optimisation Methods -- Proteins and Powders: Technical Developments -- Proteins and Powders: An Overview -- Parametric Powder Diffraction -- Powder Diffraction + Computational Methods -- Information on Imperfections -- Pair Distribution Function Technique: Principles and Methods -- Debye Analysis -- Quantitative Phase Analysis -- Quantifying amorphous phases -- Quantitative phase analysis: method developments -- Texture - an Overview -- The future of powder diffraction is 2-D -- Part 2 - Electron crystallography -- Electron Crystallography – New methods to explore Structure and Properties of the Nano World -- Image formation in the Electron Microscope -- Models for Precession Electron Diffraction -- Structure Solution using HRTEM -- Combination of X-ray Powder Diffraction, Electron Diffraction and HRTEM data -- Automated Electron Diffraction Tomography -- Automated Quantitative 3D Electron Diffraction Rotation Tomography -- Introduction to ADT/ADT3D -- Electrostatic Potential determined from Electron Diffraction Data -- Domino Phase Retrieval Algorithm for Structure Solution -- LARBED: Exploring the 4th dimension in Electron Diffraction -- Shadow Imaging for Charge Distribution Analysis -- Electron Diffraction of Protein 3D Nanocrystals -- Parallel-beam Diffraction and Direct Imaging in an aberration-corrected STEM.-Electron diffraction of commensurately and incommensurately modulated Materials -- Detection of Magnetic Circular Dichroism using TEM and EELS -- Index.-.
520			_aThe polycrystalline and nanocrystalline states play an increasingly important role in exploiting the properties of materials, encompassing applications as diverse as pharmaceuticals, catalysts, solar cells and energy storage. A knowledge of the three-dimensional atomic and molecular structure of materials is essential for understanding and controlling their properties, yet traditional single-crystal X-ray diffraction methods lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal electron diffraction techniques take over, substantially extending the range of applicability of the crystallographic principles of structure determination.  This volume, a collection of teaching contributions presented at the Crystallographic Course in Erice in 2011, clearly describes the fundamentals and the state-of-the-art of powder diffraction and electron diffraction methods in materials characterisation, encompassing a diverse range of disciplines and materials stretching from archeometry to zeolites.   As such, it is a comprehensive and valuable resource for those wishing to gain an understanding of the broad applicability of these two rapidly developing fields.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aShankland, Kenneth. _eeditor. _9356460
700	1		_aMeshi, Louisa. _eeditor. _9356461
700	1		_aAvilov, Anatoly. _eeditor. _9356462
700	1		_aDavid, William I.F. _eeditor. _9356463
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9789400755796
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-94-007-5580-2 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
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