000			01958nam a22003375i 4500
001			322563
003			MX-SnUAN
005			20160429161544.0
007			cr nn 008mamaa
008			160111s2014 gw | s |||| 0|eng d
020			_a9783642542985 _9978-3-642-54298-5
035			_avtls000423384
039		9	_y201601111037 _zstaff
050		4	_aTK7888.4
100	1		_aYu, Wenjian, _eautor. _9367849
245	1	0	_aAdvanced field-solver techniques for rc extraction of integrated circuits / _cWenjian Yu, Xiren Wang.
264		1	_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg : _bSpringer, _c2014.
300			_axv, 246 páginas : _b104 ilustraciones
336			_atexto _btxt _2rdacontent
337			_acomputadora _bc _2rdamedia
338			_arecurso en línea _bcr _2rdacarrier
347			_aarchivo de texto _bPDF _2rda
500			_aSpringer eBooks
505	0		_aIntroduction -- Basic Field-Solver Techniques for RC Extraction -- Fast Boundary Element Methods for Capacitance Extraction (I) -- Fast Boundary Element Methods for Capacitance Extraction (II) -- Resistance Extraction of Complex 3-D Interconnects -- Substrate Resistance Extraction with Boundary Element Method -- Extracting Frequency-Dependent Substrate Parasitics -- Process Variation Aware Capacitance Extraction -- Statistical Capacitance Extraction Based on Continuous-Surface Geometric Model -- Fast Floating Random Walk Method for Capacitance Extraction -- FRW Based Solver for Chip-Scale Large Structures.
590			_aPara consulta fuera de la UANL se requiere clave de acceso remoto.
700	1		_aWang, Xiren, _eautor. _9367850
710	2		_aSpringerLink (Servicio en línea) _9299170
776	0	8	_iEdición impresa: _z9783642542978
856	4	0	_uhttp://remoto.dgb.uanl.mx/login?url=http://dx.doi.org/10.1007/978-3-642-54298-5 _zConectar a Springer E-Books (Para consulta externa se requiere previa autentificación en Biblioteca Digital UANL)
942			_c14
999			_c322563 _d322563