Applied Scanning Probe Methods IX :
Tomitori, Masahiko.
Applied Scanning Probe Methods IX : Characterization / edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. - Lx, 388 páginas recurso en línea. - Nano Science and Technolgy, 1434-4904 .
Springer eBooks
Ultrathin Fullerene-Based Films via STM and STS -- Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode -- Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers -- Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells -- Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope -- Cellular Physiology of Epithelium and Endothelium -- Application of Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell -- What Can Atomic Force Microscopy Say About Amyloid Aggregates? -- Atomic Force Microscopy: Interaction Forces Measured in Phospholipid Monolayers, Bilayers and Cell Membranes -- Self-Assembled Monolayers on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability -- High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications -- Measurement of the Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM -- Evaluating Tribological Properties of Materials for Total Joint Replacements Using Scanning Probe Microscopy -- Near-Field Optical Spectroscopy of Single Quantum Constituents.
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
9783540740834
10.1007/9783540740834 doi
Applied Scanning Probe Methods IX : Characterization / edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. - Lx, 388 páginas recurso en línea. - Nano Science and Technolgy, 1434-4904 .
Springer eBooks
Ultrathin Fullerene-Based Films via STM and STS -- Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode -- Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers -- Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells -- Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope -- Cellular Physiology of Epithelium and Endothelium -- Application of Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell -- What Can Atomic Force Microscopy Say About Amyloid Aggregates? -- Atomic Force Microscopy: Interaction Forces Measured in Phospholipid Monolayers, Bilayers and Cell Membranes -- Self-Assembled Monolayers on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability -- High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications -- Measurement of the Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM -- Evaluating Tribological Properties of Materials for Total Joint Replacements Using Scanning Probe Microscopy -- Near-Field Optical Spectroscopy of Single Quantum Constituents.
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
9783540740834
10.1007/9783540740834 doi