Fib nanostructures /
Fib nanostructures /
edited by Zhiming M. Wang.
- xiii, 530 páginas : 375 ilustraciones, 200 ilustraciones en color.
- Lecture Notes in Nanoscale Science and Technology, 20 2195-2159 ; .
Springer eBooks
Preface -- Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications -- Chapter 2: Epitaxial ferroelectric nanostructures fabricated by FIB milling -- Chapter 3: Low current focused-ion-beam milling for freestanding nanomaterial characterization -- Chapter 4: Focused ion beam milling of carbon nanotube yarns and Bucky-papers: Correlating their internal structure with their macro-properties -- Chapter 5: Nanoscale electrical contacts grown by Focused-Ion-Beam (FIB) Induced Deposition -- Chapter 6: Metal induced crystallization of focused ion beam induced deposition for functional patterned ultrathin nanocarbon -- Chapter 7: Deterministic Fabrication of Micro- and Nano-Structures by Focused Ion Beam -- Chapter 8: Application of ion beam processes to scanning probe microscopy -- Chapter 9: Fabrication of needle-shaped specimens containing sub-surface nanostructures for Electron Tomography -- Chapter 10: Fabrication technique of deformation carriers (gratings and speckle patterns) with FIB for micro/nano-scale deformation measurement -- Chapter 11: Controlled Quantum Dot Formation on Focused Ion Beam patterned GaAs Substrates -- Chapter 12: Development of Functional Metallic Glassy Materials by FIB and Nano-imprint Technologies -- Chapter 13: Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrods Patterned by Focused Ion Beam -- Chapter 14: Focused Ion Beam Assisted Nano-Scale Processing and Thermoelectrical Characterization -- Chapter 15: FIB design for Nanofluidic applications -- Chapter 16: FIB Patterning of Stainless Steel for the Development of Nano-Structured Stent Surfaces for Cardiovascular Applications -- Chapter 17: Evaluation of damages induced by Ga+ focused ion beam in piezoelectric nanostructures -- Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures -- Chapter 19: Nanostructures by mass-separated FIB -- Index.
9783319028743
T174.7
Springer eBooks
Preface -- Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications -- Chapter 2: Epitaxial ferroelectric nanostructures fabricated by FIB milling -- Chapter 3: Low current focused-ion-beam milling for freestanding nanomaterial characterization -- Chapter 4: Focused ion beam milling of carbon nanotube yarns and Bucky-papers: Correlating their internal structure with their macro-properties -- Chapter 5: Nanoscale electrical contacts grown by Focused-Ion-Beam (FIB) Induced Deposition -- Chapter 6: Metal induced crystallization of focused ion beam induced deposition for functional patterned ultrathin nanocarbon -- Chapter 7: Deterministic Fabrication of Micro- and Nano-Structures by Focused Ion Beam -- Chapter 8: Application of ion beam processes to scanning probe microscopy -- Chapter 9: Fabrication of needle-shaped specimens containing sub-surface nanostructures for Electron Tomography -- Chapter 10: Fabrication technique of deformation carriers (gratings and speckle patterns) with FIB for micro/nano-scale deformation measurement -- Chapter 11: Controlled Quantum Dot Formation on Focused Ion Beam patterned GaAs Substrates -- Chapter 12: Development of Functional Metallic Glassy Materials by FIB and Nano-imprint Technologies -- Chapter 13: Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrods Patterned by Focused Ion Beam -- Chapter 14: Focused Ion Beam Assisted Nano-Scale Processing and Thermoelectrical Characterization -- Chapter 15: FIB design for Nanofluidic applications -- Chapter 16: FIB Patterning of Stainless Steel for the Development of Nano-Structured Stent Surfaces for Cardiovascular Applications -- Chapter 17: Evaluation of damages induced by Ga+ focused ion beam in piezoelectric nanostructures -- Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures -- Chapter 19: Nanostructures by mass-separated FIB -- Index.
9783319028743
T174.7