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Oscillation-Based Test in Mixed-Signal Circuits / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz.

Por: Colaborador(es): Tipo de material: TextoTextoSeries Frontiers in Electronic Testing ; 36Editor: Dordrecht : Springer Netherlands, 2006Descripción: xv, 452 páginas recurso en líneaTipo de contenido:
  • texto
Tipo de medio:
  • computadora
Tipo de portador:
  • recurso en línea
ISBN:
  • 9781402053153
Formatos físicos adicionales: Edición impresa:: Sin títuloClasificación LoC:
  • TK7888.4
Recursos en línea:
Contenidos:
Oscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation.
Resumen: Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
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Springer eBooks

Oscillation-Based Test Methodology -- Mathematical Review of Non-linear Oscillators -- OBT Methodology for Discrete-Time Filters -- OBT Methodology for discrete-time ?? Modulators -- OBT Implementation in Discrete-Time Filters -- Practical regards for OBT-OBIST implementation -- OBT-OBIST silicon validation.

Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

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