Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.

Por:

Bhushan, Bharat [editor.]

Colaborador(es):

Tipo de material: Texto

TextoSeries Nano Science and TechnolgyEditor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008Descripción: recurso en líneaTipo de contenido:

texto

Tipo de medio:

computadora

Tipo de portador:

recurso en línea

ISBN:

9783540740803

Formatos físicos adicionales: Edición impresa:: Sin títuloRecursos en línea:

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Contenidos:

Background-Free Apertureless Near-Field Optical Imaging -- Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes -- Near Field Probes: From Optical Fibers to Optical Nanoantennas -- Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging -- Scanning Probes for the Life Sciences -- Self-Sensing Cantilever Sensor for Bioscience -- AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication -- Cantilever Spring-Constant Calibration in Atomic Force Microscopy -- Frequency Modulation Atomic Force Microscopy in Liquids -- Kelvin Probe Force Microscopy: Recent Advances and Applications -- Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale -- Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.

Resumen: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Springer eBooks

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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