In-situ materials characterization : across spatial and temporal scales / edited by Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken.
Tipo de material:
TextoSeries Springer Series in Materials Science ; 193Editor: Berlin, Heidelberg : Springer Berlin Heidelberg : Springer, 2014Descripción: xi, 256 páginas : 124 ilustraciones, 78 ilustraciones en colorTipo de contenido: - texto
- computadora
- recurso en línea
- 9783642451522
- QC176.8.N35
Contenidos:
Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.
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Scanning Probe Microscopy on 'Live' Catalysts -- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources -- Advanced in situ transmission electron microscopy -- Ultra-fast TEM and Electron Diffraction -- In-Situ Materials Characterization with FIB/SEM -- In-situ X-ray photoelectron spectroscopy -- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast X-ray absorption spectroscopy -- Time-Resolved Neutron Scattering -- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.
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